Ellipsometry is an English word. Below you'll find 3 example sentences showing how it's used in practice.
Ellipsometry in a sentence
Ellipsometry meaning
An optical technique for investigating the dielectric properties of thin films, especially those used in fabricating semiconductors
Using Ellipsometry
- The main meaning on this page is: An optical technique for investigating the dielectric properties of thin films, especially those used in fabricating semiconductors
Context around Ellipsometry
- Average sentence length in these examples: 26 words
- Position in the sentence: 2 start, 0 middle, 1 end
- Sentence types: 2 statements, 1 questions, 0 exclamations
Corpus analysis for Ellipsometry
- In this selection, "ellipsometry" usually appears near the start of the sentence. The average example has 26 words, and this corpus slice is mostly made up of statements.
- Around the word, art stand out and add context to how "ellipsometry" is used.
- Recognizable usage signals include based on ellipsometry or reflectometry and ellipsometry can be. That gives this page its own corpus information beyond isolated example sentences.
- By corpus frequency, "ellipsometry" sits close to words such as aaaaand, aaah and aacl, which helps place it inside the broader word index.
Example types with ellipsometry
The same corpus examples are grouped by length and sentence type, making it easier to see the contexts in which the word appears:
Ellipsometry can be used to model the (complex) refractive index of a surface of a bulk material. (17 words)
Can we use white light source and perform wavelength-parallel measurement such as that in the state-of-art ellipsometry for the characterization of refractive index? (26 words)
For example, thin film metrology based on ellipsometry or reflectometry is used to tightly control the thickness of gate oxide, as well as the thickness, refractive index and extinction coefficient of photoresist and other coatings. (35 words)
For example, thin film metrology based on ellipsometry or reflectometry is used to tightly control the thickness of gate oxide, as well as the thickness, refractive index and extinction coefficient of photoresist and other coatings. (35 words)
Can we use white light source and perform wavelength-parallel measurement such as that in the state-of-art ellipsometry for the characterization of refractive index? (26 words)
Ellipsometry can be used to model the (complex) refractive index of a surface of a bulk material. (17 words)
Can we use white light source and perform wavelength-parallel measurement such as that in the state-of-art ellipsometry for the characterization of refractive index? (26 words)
Example sentences (3)
Can we use white light source and perform wavelength-parallel measurement such as that in the state-of-art ellipsometry for the characterization of refractive index?
Ellipsometry can be used to model the (complex) refractive index of a surface of a bulk material.
For example, thin film metrology based on ellipsometry or reflectometry is used to tightly control the thickness of gate oxide, as well as the thickness, refractive index and extinction coefficient of photoresist and other coatings.